ஐ.எஸ்.எஸ்.என்: 2319-7293
Luis Mejia Sanchez
The philosophy of Build-In-Reliability (BIR) or Design for Reliability (DFR) emphasizes the value of reliability prediction at a product’s conceptual design stage. Due to the lack of reliability data, reliability assessment of a new design is not usually performed at this stage. In this paper, we propose a methodology to provide the reliability insight of a new design concept. The methodology consists of three major processes: functional analysis, cognitive map and Bayesian network modeling. A case study is given to demonstrate our proposed method.